5.1.2 Synchrotron XRF analysis
The specific features of the synchrotron beams are advantageous for a number of advanced x-ray spectrometry techniques. At a dedicated beam line at Elettra Synchrotronis an ultra-high vacuum chamber is being commissioned in partnership with the IAEA for different XRF applications.
Synchrotron radiation is advantageous for many XRS applications because of several properties.
Elemental analysis for inhomogeneous samples (sub-mm spatially resolved XRF).
Trace analysis down to sub-ppb levels by using Total Reflection XRF.
Characterization of layered materials with depth resolution in the nanometre range (via Grazing Incidence or Grazing Exit X-Ray Fluorescence (GI/GE-XRF)).
Chemical speciation of specific elements (X-ray Absorption Near Edge Structure -XANES).
Determination of layer thicknesses and optical constants via X-Ray Reflectometry (XRR).
